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Contrast transfer function : ウィキペディア英語版
Contrast transfer function

The contrast transfer function〔Spence, John C. H. (1988 2nd ed) ''Experimental high-resolution electron microscopy'' (Oxford U. Press, NY) ISBN 0195054059.〕〔Ludwig Reimer (1997 4th ed) ''Transmission electron microscopy: Physics of image formation and microanalysis'' (Springer, Berlin) (preview ).〕〔Earl J. Kirkland (1998) ''Advanced computing in electron microscopy'' (Plenum Press, NY).〕 mathematically describes how aberrations in a transmission electron microscope modify the image of a sample. This contrast transfer function (CTF) sets the resolution of High-Resolution Transmission Electron Microscopy (HRTEM), also known as phase contrast TEM.
By considering the recorded image as a CTF-degraded true object, describing the CTF allows the true object to be reverse-engineered. This is typically denoted CTF-correction, and is vital to obtain high resolution structures in three-dimensional electron microscopy, especially cryo-electron microscopy. Its equivalent in light-based optics, is the optical transfer function.
==Phase Contrast in HRTEM==

The contrast in HRTEM comes from interference in the image plane between the phases of scattered electron waves with the phase of the transmitted electron wave. When an electron wave passes through a sample in the TEM, complex interactions occur. Above the sample, the electron wave can be approximated as a plane wave. As the electron wave, or wavefunction, passes through the sample, both the phase and the amplitude of the electron beam is altered. The resultant scattered and transmitted electron beam is then focused by an objective lens, and imaged by a detector in the image plane.
Detectors are only able to directly measure the amplitude, not the phase. However, with the correct microscope parameters, the phase interference can be indirectly measured via the intensity in the image plane. Electrons interact very strongly with crystalline solids. As a result, the phase changes due to very small features, down to the atomic scale, can be recorded via HRTEM.

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